2016 / 12 / 14
7 inch HQ display + Φ 4.5 mm 2 way short tip articulation
● HQ 7" TFT LCD ●
Snap shot and video recording (640*480) ● Short Tip Articulation ● Outer braided Stainless steel Probe
2016 / 06 / 30
7 inch wireless boescope is coming soon. !!!
2016 / 05 / 15
Borescope 7" display ( JK Series ) is now available for sale. Buy five get one for free.
● 7" TFT LCD ●
Snap shot and video recording (640*480) ●
LED brightness adjustment ●
Zoom in and image rotation ●
USB to PC connection (optional software) ●
Long duty hour ●
2016 / 03 / 22
Industrial Endoscope Borescope Videoscope are now on Sale. !!!
2016 / 01 / 16
Exclusive electronic eyepieces for microscopes are equipped with high pixels, image processing software. Watch, capture and record live image on your computer from your microscope.
Microscopes can be separated into several different classes. One grouping is based on what interacts with the sample to generate the image, i.e., light or photons (optical microscopes), electrons (electron microscopes) or a probe (scanning probe microscopes). Alternatively, microscopes can be classed on whether they analyze the sample via a scanning point (confocal optical microscopes, scanning electron microscopes and scanning probe microscopes) or analyze the sample all at once (wide field optical microscope and transmission electron microscopes).
Wide field optical microscopes and transmission electron microscopes both use the theory of lenses (optics for light microscopes and electromagnet lenses for electron microscopes) in order to magnify the image generated by the passage of a wave transmitted through the sample, or reflected by the sample. The waves used are electromagnetic (in optical microscopes) or electron beams (in electron microscopes). Resolution in these microscopes is limited by the wavelength of the radiation used to image the sample, where shorter wavelengths allow for a higher resolution.
Scanning optical and electron microscopes, like the confocal microscope and scanning electron microscope, use lenses to focus a spot of light or electrons onto the sample then analyze the signals generated by the beam interacting with the sample. The point is then scanned over the sample to analyze a rectangular region. Magnification of the image is achieved by displaying the data from scanning a physically small sample area on a relatively large screen. These microscopes have the same resolution limit as wide field optical, probe, and electron microscopes.
Scanning probe microscopes also analyze a single point in the sample and then scan the probe over a rectangular sample region to build up an image. As these microscopes do not use electromagnetic or electron radiation for imaging they are not subject to the same resolution limit as the optical and electron microscopes described above.